Thin films|30 Article(s)
Te-free SbBi thin film as a laser heat-mode photoresist
Kui Zhang, Zhengwei Wang, Guodong Chen, Yang Wang, Aijun Zeng, Jing Zhu, Syarhei Avakaw, and Heorgi Tsikhanchuk
Chinese Optics Letters
  • Publication Date: Sep. 10, 2019
  • Vol. 17, Issue 9, 093102 (2019)
A reflecting-type highly efficient terahertz cross-polarization converter based on metamaterials
Xiaoqing Luo, Zhiyong Tan, Chang Wang, and Juncheng Cao
Chinese Optics Letters
  • Publication Date: Sep. 10, 2019
  • Vol. 17, Issue 9, 093101 (2019)
An ORMOSIL porous double-layer broadband antireflective coating
Huai Xiong, Yongxing Tang, Lili Hu, and Haiyuan Li
Chinese Optics Letters
  • Publication Date: Mar. 10, 2019
  • Vol. 17, Issue 3, 033101 (2019)
Effect of annealing on the damage threshold and optical properties of HfO2/Ta2O5/SiO2 high-reflection film
Jianing Dong, Jie Fan, Sida Mao, Yunping Lan, Yonggang Zou, Haizhu Wang, Jiabin Zhang, and Xiaohui Ma
The effect of thermal annealing on the optical properties, microstructure, and laser-induced damage threshold (LIDT) of HfO2/Ta2O5/SiO2 HR films has been investigated. The transmission spectra shift to a short wavelength and the X-ray diffraction peaks of monoclinic structure HfO2 are enhanced after thermal annealing. The calculated results of the m( 111) diffraction peak show that the HfO2 grain size is increased, which is conducive to increasing the thermal conductivity. Thermal annealing also reduces the laser absorption of high-reflection films. The improvement of thermal conductivity and the decrease of laser absorption both contribute to the improvement of LIDT. The experimental results show that the highest LIDT of 22.4 J/cm2 is obtained at 300°C annealing temperature. With the further increase of annealing temperature, the damage changes from thermal stress damage to thermal explosion damage, resulting in the decrease of LIDT.
Chinese Optics Letters
  • Publication Date: Nov. 10, 2019
  • Vol. 17, Issue 11, 113101 (2019)
Simultaneous measurements of s- and p-polarization reflectivity with a cavity ring-down technique employing no polarization optics
Hao Cui, Bincheng Li, Yanling Han, Jing Wang, Chunming Gao, and Yafei Wang
The cavity ring-down (CRD) technique is adopted for simultaneously measuring s- and p-polarization reflectivity of highly reflective coatings without employing any polarization optics. As the s- and p-polarized light trapped in the ring-down cavity decay independently, with a randomly polarized light source the ring-down signal recorded by a photodetector presents a double-exponential waveform consisting of ring-down signals of both s- and p-polarized light. The s- and p-polarization reflectivity values of a test mirror are therefore simultaneously determined by fitting the recorded ring-down signal with a double-exponential function. The determined s- and p-polarization reflectivity of 30° and 45° angle of incidence mirrors are in good agreement with the reflectivity values measured with the conventional CRD technique employing a polarizer for polarization control.
Chinese Optics Letters
  • Publication Date: May. 10, 2017
  • Vol. 15, Issue 5, 053101 (2017)
Temperature coefficient of the refractive index for PbTe film
Lingmao Xu, Hui Zhou, Yanchun He, Kaifeng Zhang, Shenghu Wu, and Yuqing Xiong
Specimens of PbTe single film are deposited on Ge substrates by vacuum thermal evaporation. During the temperature range of 80–300 K, the transmittance of a PbTe film within 2–15 μm is measured every 20 K by the PerkinElmer Fourier transform infrared spectroscopy cryogenic testing system. Then, the relationship between the refractive index and wavelength within 7–12 μm at different temperatures is received by the full spectrum inversion method fitting. It can be seen that the relationship conforms to the Cauchy formula, which can be fitted. Then, the relationship between the refractive index of the PbTe film and the temperature/wavelength can be expressed as n(λ,T)=5.82840 0.00304T+4.61458×10 6T2+8.00280/λ2+0.21544/λ4, which is obtained by the fitting method based on the Cauchy formula. Finally, the designed value obtained by the formula and the measured spectrum are compared to verify the accuracy of the formula.
Chinese Optics Letters
  • Publication Date: Apr. 10, 2017
  • Vol. 15, Issue 4, 043101 (2017)
Optical property of an antireflection coating fabricated by an optimal spin-coating method with a pH-modified SiO2 nanoparticle solution
Chyan-Chyi Wu, Cheng-Chih Hsu, Yu-Chian Lin, Chia-Wei Chiang, and Ching-Lian Dai
Chinese Optics Letters
  • Publication Date: Feb. 10, 2017
  • Vol. 15, Issue 2, 023101 (2017)
Fabrication of multi-wavelength visible and infrared filter for solar atmosphere tomographic imaging
Mingdong Kong, Chun Guo, Bincheng Li, Wenyan He, and Ming Wei
To simultaneously obtain high-resolution multi-wavelength (from visible to near infrared) tomographic images of the solar atmosphere, a high-performance multi-wavelength optical filter has to be used in solar imaging telescopes. In this Letter, the fabrication of the multi-wavelength filter for solar tomographic imaging is described in detail. For this filter, Ta2O5 and SiO2 are used as high- and low-index materials, respectively, and the multilayer structure is optimized by commercial Optilayer software at a 7.5° angle of incidence. Experimentally, this multi-wavelength optical filter is prepared by a plasma ion-assisted deposition technique with optimized deposition parameters. High transmittance at 393.3, 396.8, 430.5, 525, 532.4, 656.8, 705.8, 854.2, 1083, and 1565.3 nm, as well as high reflectance at 500 and 589 nm are achieved. Excellent environmental durability, demonstrated via temperature and humidity tests, is also established.
Chinese Optics Letters
  • Publication Date: Dec. 10, 2017
  • Vol. 15, Issue 12, 123101 (2017)
Optimization of the spectral performance of an antireflection coating on a micro-spherical substrate
Chun Guo, Mingdong Kong, and Wenyan He
Chinese Optics Letters
  • Publication Date: Sep. 10, 2016
  • Vol. 14, Issue 9, 093101 (2016)
Design of Pd/B4C aperiodic multilayers for 8–12  nm region with flat reflectivity profile
Yiwen Wang, Qiushi Huang, Qiang Yi, Li Jiang, Zhong Zhang, and Zhanshan Wang
Chinese Optics Letters
  • Publication Date: Jul. 10, 2016
  • Vol. 14, Issue 7, 073101 (2016)
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